Written for engineers, researchers, and quality professionals, the eBook links advanced analytical methods to day-to-day ...

Failure analysis (FA) is an essential step for achieving sufficient yield in semiconductor manufacturing, but it’s struggling to keep pace with smaller dimensions, advanced packaging, and new power ...

Experts at the Table: Semiconductor Engineering sat down to discuss how increasing complexity in semiconductor and packaging technology is driving shifts in failure analysis methods, with Frank Chen, ...

We all have times when we underperform. When failures happen, most of us are highly motivated to perform better next time. To do that, we need to intelligently understand what went wrong. However, ...

Pinhole defects in aluminium beverage cans are traced to embedded particles from rolling, with SEM/EDS revealing their root ...